JPH0560673B2 - - Google Patents

Info

Publication number
JPH0560673B2
JPH0560673B2 JP61143902A JP14390286A JPH0560673B2 JP H0560673 B2 JPH0560673 B2 JP H0560673B2 JP 61143902 A JP61143902 A JP 61143902A JP 14390286 A JP14390286 A JP 14390286A JP H0560673 B2 JPH0560673 B2 JP H0560673B2
Authority
JP
Japan
Prior art keywords
light
receiving
light receiving
optical sensor
sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP61143902A
Other languages
English (en)
Japanese (ja)
Other versions
JPS63176A (ja
Inventor
Hikari Tanaka
Shigeru Kimura
Toshiaki Ikeda
Tooru Tanabe
Seiichi Sudo
Takao Seto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Honda Motor Co Ltd
Stanley Electric Co Ltd
Original Assignee
Honda Motor Co Ltd
Stanley Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Honda Motor Co Ltd, Stanley Electric Co Ltd filed Critical Honda Motor Co Ltd
Priority to JP61143902A priority Critical patent/JPS63176A/ja
Priority to US07/062,442 priority patent/US4808812A/en
Priority to CA000539917A priority patent/CA1277390C/en
Priority to DE3720406A priority patent/DE3720406C2/de
Priority to FR878708621A priority patent/FR2600459B1/fr
Priority to GB8714400A priority patent/GB2192709B/en
Publication of JPS63176A publication Critical patent/JPS63176A/ja
Publication of JPH0560673B2 publication Critical patent/JPH0560673B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/50Encapsulations or containers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • G01J1/0407Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • G01J1/0407Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0411Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using focussing or collimating elements, i.e. lenses or mirrors; Aberration correction
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4228Photometry, e.g. photographic exposure meter using electric radiation detectors arrangements with two or more detectors, e.g. for sensitivity compensation
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/40Optical elements or arrangements
    • H10F77/407Optical elements or arrangements indirectly associated with the devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/0204Compact construction
    • G01J1/0209Monolithic
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/0214Constructional arrangements for removing stray light
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation
    • H01L2924/1815Shape

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Light Receiving Elements (AREA)
JP61143902A 1986-06-19 1986-06-19 複合型光センサ Granted JPS63176A (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP61143902A JPS63176A (ja) 1986-06-19 1986-06-19 複合型光センサ
US07/062,442 US4808812A (en) 1986-06-19 1987-06-11 Composite type light sensor having plural sensors with different light receiving angle optical characteristics
CA000539917A CA1277390C (en) 1986-06-19 1987-06-17 Composite type light sensor
DE3720406A DE3720406C2 (de) 1986-06-19 1987-06-19 Lichtsensor
FR878708621A FR2600459B1 (fr) 1986-06-19 1987-06-19 Detecteur de lumiere de type composite
GB8714400A GB2192709B (en) 1986-06-19 1987-06-19 Composite light sensor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61143902A JPS63176A (ja) 1986-06-19 1986-06-19 複合型光センサ

Publications (2)

Publication Number Publication Date
JPS63176A JPS63176A (ja) 1988-01-05
JPH0560673B2 true JPH0560673B2 (en]) 1993-09-02

Family

ID=15349723

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61143902A Granted JPS63176A (ja) 1986-06-19 1986-06-19 複合型光センサ

Country Status (6)

Country Link
US (1) US4808812A (en])
JP (1) JPS63176A (en])
CA (1) CA1277390C (en])
DE (1) DE3720406C2 (en])
FR (1) FR2600459B1 (en])
GB (1) GB2192709B (en])

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3821743A1 (de) * 1988-06-28 1990-01-11 Bosch Gmbh Robert Sensor zur erfassung der einstrahlung
US4933550A (en) * 1988-07-15 1990-06-12 Hegyi Dennis J Photodetector system with controllable position-dependent sensitivity
EP0363520A1 (en) * 1988-10-14 1990-04-18 Wako Corporation A photoelectric sensor
US4916309A (en) * 1989-01-09 1990-04-10 Byk-Gardner, Inc. Appliance for converting reflectance measuring instrument into a transmittance measuring instrument
US4972089A (en) * 1989-04-03 1990-11-20 Motorola Inc. Single package electro-optic transmitter-receiver
US5130531A (en) * 1989-06-09 1992-07-14 Omron Corporation Reflective photosensor and semiconductor light emitting apparatus each using micro Fresnel lens
JP3067151B2 (ja) * 1990-03-13 2000-07-17 日本電気株式会社 光電気変換素子サブキャリア
US5149958A (en) * 1990-12-12 1992-09-22 Eastman Kodak Company Optoelectronic device component package
JP2603522Y2 (ja) * 1991-03-29 2000-03-15 日本電気株式会社 イメージセンサ
US5466928A (en) * 1993-05-20 1995-11-14 Nikon Corporation Light detection device bonded to an optics housing which includes tapered cavities for delivering adhesive to the bonding surface
DE4317221A1 (de) * 1993-05-24 1994-12-01 Brodhag Angelika Komponentenkamera für Groß- und Mittelformat
DE4407792C1 (de) * 1994-03-09 1995-07-13 Nat Rejectors Gmbh Vorrichtung zur optischen Prüfung von Münzen
US5508625A (en) * 1994-06-23 1996-04-16 The Boeing Company Voltage stand off characteristics of photoconductor devices
JP3249029B2 (ja) * 1995-04-21 2002-01-21 キヤノン株式会社 密着型イメージセンサ及びそれを用いた情報処理装置
JPH08330608A (ja) * 1995-05-29 1996-12-13 Oki Electric Ind Co Ltd 受光センサおよび受発光センサ
DE19608650C1 (de) * 1996-03-06 1997-09-04 Bosch Gmbh Robert Vorrichtung zum Erfassen von Benetzungsereignissen auf einer Scheibe
DE19624494A1 (de) * 1996-06-19 1998-01-02 Sick Ag Sensoranordnung
DE19704415A1 (de) 1997-02-06 1998-08-13 Hella Kg Hueck & Co Sensoreinrichtung für eine automatische Fahrlichtschaltung
DE19704413A1 (de) 1997-02-06 1998-08-13 Hella Kg Hueck & Co Sensoreinrichtung für eine automatische Fahrlichtschaltung
JP4172558B2 (ja) * 1998-11-11 2008-10-29 シチズン電子株式会社 赤外線通信デバイス
DE19855220A1 (de) * 1998-11-30 2000-05-31 Sick Ag Opto-elektronischer Sensor und Verfahren zu dessen Herstellung
JP2001033237A (ja) * 1999-07-16 2001-02-09 Seiko Precision Inc 光学検知装置
DE19933642A1 (de) * 1999-07-17 2001-03-08 Bosch Gmbh Robert Lichtempfindliche Sensoreinheit, insbesondere zum automatischen Schalten von Beleuchtungseinrichtungen
JP2001033678A (ja) * 1999-07-21 2001-02-09 Seiko Precision Inc 光学検知装置
DE10256645A1 (de) * 2002-12-03 2004-06-17 Hella Kg Hueck & Co. Sensorvorrichtung
USD506450S1 (en) * 2003-08-27 2005-06-21 Kabushiki Kaisha Toshiba Optical semiconductor device
JP4134912B2 (ja) * 2004-01-22 2008-08-20 株式会社デンソー 光検出器
DE102004003686A1 (de) * 2004-01-24 2005-08-18 Hella Kgaa Hueck & Co. Vorrichtung für ein Kraftfahrzeug zum Messen von Licht
DE102004027512A1 (de) * 2004-06-04 2005-12-22 Robert Bosch Gmbh Spektroskopischer Gassensor, insbesondere zum Nachweis mindestens einer Gaskomponente in der Umluft, und Verfahren zur Herstellung eines derartigen spektroskopischen Gassensors
WO2006117226A1 (de) 2005-05-04 2006-11-09 Preh Gmbh Vorrichtung zur erfassung von umgebungs- und vorfeldlicht in einem kraftfahrzeug
DE102005025606B4 (de) * 2005-06-03 2015-10-01 Vishay Semiconductor Gmbh Sonnensensor und Herstellungsverfahren hierfür
DE102006031677A1 (de) * 2006-07-08 2008-01-10 Hella Kgaa Hueck & Co. Lichtsensor mit einer Sensormatrix
JP2009014901A (ja) * 2007-07-03 2009-01-22 Totoku Electric Co Ltd 液晶表示ユニット
US20090095075A1 (en) * 2007-10-12 2009-04-16 Yevgeniy Vinshtok Sensor housing
US8450821B2 (en) 2009-03-26 2013-05-28 Micron Technology, Inc. Method and apparatus providing combined spacer and optical lens element
DE102011105374B4 (de) 2011-06-22 2021-12-23 OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung Verfahren zum Herstellen einer Mehrzahl von optoelektronischen Halbleiterbauelementen im Verbund
CN107314810B (zh) * 2017-08-09 2018-07-06 江苏日盈电子股份有限公司 光线传感器
JP6991462B2 (ja) * 2018-03-15 2022-01-12 オムロン株式会社 小型光電センサ
CN114641672A (zh) 2019-11-18 2022-06-17 株式会社村田制作所 光传感器
CN114641671A (zh) 2019-11-18 2022-06-17 株式会社村田制作所 光传感器

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2253699C3 (de) * 1972-11-02 1978-11-23 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt Halbleiter-Optokoppler und Verfahren zu seiner Herstellung
JPS59596Y2 (ja) * 1975-03-14 1984-01-09 株式会社ニコン ロシウツケイノジユコウキ
JPS54141690A (en) * 1978-04-26 1979-11-05 Murata Manufacturing Co Infrared ray detector and making method thereof
JPS54146682A (en) * 1978-05-08 1979-11-16 Murata Manufacturing Co Infrared ray detector
US4309605A (en) * 1979-10-02 1982-01-05 New Japan Radio Co., Ltd. Photo-reflective sensor
US4331868A (en) * 1980-02-14 1982-05-25 Mash William R Mounting system for optical controls
US4544269A (en) * 1980-07-25 1985-10-01 Canon Kabushiki Kaisha Device for measuring light incident on an optical system
US4425501A (en) * 1981-03-30 1984-01-10 Honeywell Inc. Light aperture for a lenslet-photodetector array
JPS58192366A (ja) * 1982-05-07 1983-11-09 Hitachi Ltd 受光素子内蔵集積回路装置
JPS58216474A (ja) * 1982-06-10 1983-12-16 Toshiba Corp 光半導体装置
US4528446A (en) * 1982-06-30 1985-07-09 Honeywell Inc. Optoelectronic lens array with an integrated circuit
JPS5958643U (ja) * 1982-10-13 1984-04-17 日産自動車株式会社 車両用ライト点消装置
US4667092A (en) * 1982-12-28 1987-05-19 Nec Corporation Solid-state image device with resin lens and resin contact layer
US4609820A (en) * 1983-04-07 1986-09-02 Fujitsu Limited Optical shield for image sensing device
US4695719A (en) * 1983-12-05 1987-09-22 Honeywell Inc. Apparatus and method for opto-electronic package
US4587421A (en) * 1984-04-19 1986-05-06 Hei, Inc. Photo-optic transducing head assembly
US4650998A (en) * 1984-12-10 1987-03-17 Siemens Corporate Research & Support, Inc. Highly aligned optical device

Also Published As

Publication number Publication date
GB2192709A (en) 1988-01-20
US4808812A (en) 1989-02-28
DE3720406A1 (de) 1988-01-07
GB2192709B (en) 1989-12-13
FR2600459A1 (fr) 1987-12-24
FR2600459B1 (fr) 1990-08-31
DE3720406C2 (de) 1994-03-24
GB8714400D0 (en) 1987-07-22
JPS63176A (ja) 1988-01-05
CA1277390C (en) 1990-12-04

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